New hybrid nano-microscope by KRISS allows simultaneous measurement of optical and electrical properties. Expected to accelerate nano-scale research on advanced equipment and materials such as bilayer ...
Hexagon Metrology Inc. (www.hexagonmetrology.us) has launched a new line of multi-sensor measurement systems that feature optical, camera, laser and tactile probing options in a wide variety of ...
Olympus has introduced the new Diffusion Measurement module for Olympus ASW 2.1 software. Designed specifically for use with the Olympus FluoView FV1000 confocal microscope system for live cell ...
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