One of the major types of materials analyzed using optical spectroscopy is thin films. Unlike some thin films that are self-supporting, ultra thin films are deposited on a substrate. These ultra thin ...

McPherson (Chelmsford MA USA) is pleased to announce a new vacuum ultraviolet spectral test system VUV-STS. The new system measures reflectance as a function of angle of incidence. It measures optical ...

Schematic of a grazing incidence small and wide angle X-ray scattering (GISAXS/GIWAXS) experimental setup showing the incident (αi) and the scattered angles along the horizontal (2θf) and vertical (αf ...

Using thin films of dielectric materials in optical coatings have long been common practice in the glass and optics industries. For example, Bragg mirrors in laser cavities are formed using ...